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- Details
- Description
- Published by:
- Eddard Green
- Published:
- 10/17/2014
- Specs:
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Flyer / 8.25" x 10.75"2 pages
- Category:
- Business & Finance
- Tags:
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
Other Publications by Eddard Green
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Flyer / 8.25" x 10.75"Print: $0.52 +
Digital: $2.00
